Resume

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Education

2013: PhD student in Materials Science

Institut Pprime, Dep. Physique et Mécanique des Matériaux, France
CNRS ⋅ Université de Poitiers ⋅ ISAE-ENSMA, France

2010: Master’s Degree

Specialising in Materials Science (with high honours)
Université de Poitiers, France

2008: Bachelor’s Degree

Specialising in Physics and Chemistry (with honours)
Université de Poitiers, France


Research experience

2015–present: Associate Professor (Maître de Conférences)

Laboratoire d’Étude des Microstructures et de Mécanique des Matériaux, Dep. Ingénierie des Microstructures, Procédés, Anisotropie, Comportement, France

 

2014–2015: Postdoc in Materials Science

Paul Scherrer Institut, Photons for Engineering and Manufacturing group, Switzerland
Topic: Multiaxial and multiscale plasticity in metals.
Supervisor: Pr. H. Van Swygenhoven

 

2010–2013: PhD in Materials Science

Institut Pprime, Dep. Physique et Mécanique des Matériaux, France
Thesis: Deformation mechanisms of MAX phases.
Supervisors: Pr. A. Joulain, Pr. L. Thilly and Pr. C. Tromas

 

2010: Master’s research project

Institut Pprime, Dep. Physique et Mécanique des Matériaux, France
Subject: Characterisation of deformation mechanisms of MAX phases.
Supervisors: Pr. A. Joulain, Pr. L. Thilly and Pr. C. Tromas

 

2009: Laboratory training

Phymat, Université de Poitiers, France
Subject: Study of Y2O3 thin films by X-ray Photoelectron Spectroscopy (XPS)
Supervisor: Dr. F. Paumier


Research skills

Large facilities — in-situ deformation:

Deformation techniques:

Small scale mechanical testing, compression test, tensile test, bi-axial tensile test, compression under gaseous confining pressure (Paterson’s apparatus), nanoindentation

 

Microscopy and microstructure analysis:

Transmission Electron Microscopy (sample preparation, weak beam, dislocation analysis, nanodiffraction), Automated Crystal Orientation Mapping (ACOM, NanoMEGAS, ASTAR), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Energy Dispersive X-Ray (EDX), Electron Backscatter Diffraction (EBSD), Electron Channeling Contrast Imaging (ECCI), Transmission Kikuchi Diffraction (TKD), Optical Microscopy

 

Sample synthesis, characterization and preparation:

Powder metallurgy (Hot Isostatic Pressing), picosecond laser ablation, Focused Ion Beam (FIB), sample preparation (cutting, mechanical and chemical polishing…), x-ray diffraction (Rietveld refinement)

 

Softwares & Computing:

Origin, Mathematica, Matlab, MAUD (Materials Analysis Using Diffraction), FEM simulations (ANSYS, ABAQUS), Fortran language, LATEX, ImageJ, MS Offce, LibreOffce, Adobe suite, The Gimp, Linux, MacOS, Windows